XRF (X-ray fluorescence) is a non-destructive analytical technique used to determine the elemental composition of materials. This is an excellent technology for qualitative and quantitative analysis of material composition.
Available Instrument : GemmoFTIR™
Key Features
- Analyze from Sodium (Na) through Uranium (92U)
- Non-destructive elemental analysis
- Quantify solids, slurries, liquids, powders and coatings
- Polarized excitation delivers lower detection limits
- Analysis in air, helium or vacuum
- Advanced novel treatment of peak overlap reduces errors
Sample Acceptance and Analysis
- At least 50 mg of sample is required as a powder, solid, semisolid etc.
- Based on the customer request, results are reported as elemental percentages and/or their oxide %. Instrument measures the elemental % only and not the oxidation state of the element. Thus the oxide forms of the results do not represent the actual compound
